CONTV-W
CONTV-W
CONTV-W
CONTV-W

CONTV-W General Contact

Wafer, No Reflex Coating

$5,000.00 (USD)

Model: CONTV-W
Resonant Frequency (kHz): 13
Spring Constant (N/m): 0.2
Tip Radius (nm): 8
Qty:
Value Line etched Silicon probes for imaging in contact mode in air. 

 Product Sheet

Specifications:
- 0.2 N/m, 13 kHz, 10 nm tip radius, no reflex coating.
- 375 probes per wafer.
- Compatible with most commercially available AFMs.

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5º º
Side Angle (SA): 22.5 ± 2.5º º
Tip Radius (Nom): 8 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5-25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.5 - 2.5 µm
Back Side Coating: Reflective Aluminum