CONTV-AW General Contact

Wafer, Al Reflex Coating

$5,190.00 (USD)

Resonant Frequency (kHz): 13
Spring Constant (N/m): 0.2
Tip Radius (nm): 8
Value Line etched Silicon probes for imaging in contact mode in air. 

 Product Specs

- 0.2 N/m, 13 kHz, 10 nm tip radius, Al reflex coating.
- 375 probes per wafer.
- Compatible with most commercially available AFMs.

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, very reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.5 - 2.5 µm
Back Side Coating: Reflective Aluminum