Value Line etched Silicon contact mode probes with conductive Platinum-Iridium(PtIr) coating on the tip for electrical characterization of samples.
- Conductive PtIr coated tip that is ideal for various contact mode electrical applications such as:
*Tunneling AFM andConductive AFM (TUNA and CAFM)
*Scanning Capacitance Microscopy (SCM)
- 0.2 N/m, 13 kHz, 25 nm tip radius, PtIr reflex coating.
- 10 probes per pack.
- Compatible with most commercially available AFMs.