Value Line etched Silicon probes with conductive Platinum-Iridium (PtIr) coating on the tip for electrical characterization of samples.
- Conductive PtIr coated tip that is ideal for various electrical applications such as:
*Electrical Force Microscopy (EFM)
*Surface Potential Microscopy orKelvin Probe Force Microscopy (SPoM or KPFM)
*Tunneling AFM andConductive AFM (TUNA and CAFM)
*Scanning Capacitance Microscopy (SCM)
*Piezoforce Microscopy (PFM)
- 2.8 N/m, 75 kHz, 25 nm tip radius, PtIr reflex coating.
- 10 probes per pack.
- Compatible with most commercially available AFMs.