NCHV-AW General Tapping/Non-Contact

Wafer, Al Reflex Coating

$5,190.00 (USD)

Model: NCHV-AW
Resonant Frequency (kHz): 320
Spring Constant (N/m): 40
Tip Radius (nm): 8
Value Line etched Silicon probes for imaging in TappingMode and non-contact mode in air. 

 Product Sheet

- 40 N/m, 320 kHz, 8 nm tip radius, Al reflex coating.
- 375 probes per wafer.
- Compatible with most commercially available AFMs.

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip SetBack (TSB)(Nom): 12.5 µm
Tip Set Back (TSB)(RNG): 9 - 16 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.5 µm
Cantilever Thickness (RNG): 2.8 - 4.2 µm
Back Side Coating: Reflective Aluminum