NCLV-W
NCLV-W
NCLV-W
NCLV-W

NCLV-W Long Cantilever

Wafer, No Reflex Coating

$5,000.00 (USD)

Model: NCLV-W
Resonant Frequency (kHz): 190
Spring Constant (N/m): 48
Tip Radius (nm): 8
Qty:
Value Line etched Silicon long-cantilever probes for imaging in TappingMode and non-contact mode in air. 

 Product Sheet

Specifications:
- 48 N/m, 190 kHz, 10 nm tip radius, no reflex coating.
- 375 probes per wafer.
- Compatible with most commercially available AFMs.

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 7 µm
Cantilever Thickness (RNG): 6.5 - 7.5 µm