Selecting the Right AFM Probe

Topography only
No
Yes
  • Most common: Choose NCHV / NCHV-A for Tapping mode imaging applications in air. Note: NCHV-A adds reflective Al coating, minimizes interferences on reflective samples
  • Choose TESPD if added wear resistance is desired
  • Choose FMV / FMV-A for very soft samples
  • Choose CONTV for contact mode imaging in air or in liquid.
  • Less common: Choose NCLV / NCLV-A for large amplitude tapping
Phase imaging based maps of components, microphases, or mechanical differences
No
Yes
  • Choose NCLV / NCHV-A for Tapping mode phase imaging on medium to hard samples
  • Choose FMV / FMV-A for Tapping mode phase imaging on very soft samples
Contact mode based electrical measurement
No
Yes
  • Choose FMV-PT for most conductive AFM (CAFM), tunneling AFM (TUNA), scanning capacitance microscopy (SCM), and piezoresponse force microscopy (PFM) applications
  • Choose CONTV for conductive AFM (CAFM) on very soft samples
Tapping mode based electrical or magnetic measurement
No
Yes
No
  • Choose FMV-PT for Electric Force Microscopy (EFM) and Surface Potential Microscopy (SPoM), also known as Kelvin Probe Force Microscopy (KPFM)
  • Choose MFMV for Magnetic Force Microscopy (MFM)
No
Yes
  • For all other applications, go to brukerafmprobes.com. For example:
  • All PeakForce Tapping needs in air and fluid
  • Nanomechanical mapping with PeakForce QNM
  • Supersharp probes for highest resolution
  • Fluid imaging other than contact mode